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Federal
NIST X-ray Photoelectron Spectroscopy Database - SRD 20
National Institute of Standards and Technology —
NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for... -
Federal
NIST Electron Inelastic-Mean-Free-Path Database - SRD 71
National Institute of Standards and Technology —
The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-... -
Federal
NIST Electron Effective-Attenuation-Length Database - SRD 82
National Institute of Standards and Technology —
The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron... -
Federal
Data for "Gold-Induced Chemical Perturbations in CdTe-Based Photovoltaic Cells"
Department of Energy —
Back contacting p-type CdTe has been identified as one of the major areas of loss in CdTe photovoltaic (PV) power conversion efficiency (PCE). In research settings,...