Data Catalog

• Federal

  Detection Limits for SEM Image Segmentation

  National Institute of Standards and Technology —

  The dataset consists of six collections of SEM images, three trained U-net AI models, and CSV files with image quality metrics and trained AI model accuracy metrics....

  • zip file with six subfolders containing SEM image collections
  • zip file contains mask images and the initial intensity image with max contrast and min noise
  • zip contains three folders with TensorFlow AI models
  • zip file contains a folder with image quality metrics and a folder with AI model accuracy
  • URL
  • HTML
  • 1 more in dataset
• Federal

  Software to Process 3D Scanner Data

  National Institute of Standards and Technology —

  This software was developed per the ASTM E3125-17 documentary standard for 3D imaging systems. The software was written in MATLAB and Python and sample sphere data...

  • A version controlled repository on Github.com
  • HTML
• Federal

  X-ray Metrology for the Semiconductor Industry Tutorial

  National Institute of Standards and Technology —

  Video tutorials from NIST workshop on X-ray metrology for the semiconductor industry

  • HTML

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