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    • Prognostics of Power MOSFET

    Metadata Updated: September 19, 2025

    This paper demonstrates how to apply prognostics to power MOSFETs (metal oxide field effect transistor). The methodology uses thermal cycling to age devices and Gaussian process regression to perform prognostics. The approach is validated with experiments on 100V power MOSFETs. The failure mechanism for the stress conditions is determined to be die-attachment degradation. Change in ON-state resistance is used as a precursor of failure due to its dependence on junction temperature. The experimental data is augmented with a finite element analysis simulation that is based on a two-transistor model. The simulation assists in the interpretation of the degradation phenomena and SOA (safe operation area) change.

    Access & Use Information

    Public: This dataset is intended for public access and use. License: No license information was provided. If this work was prepared by an officer or employee of the United States government as part of that person's official duties it is considered a U.S. Government Work.

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    Dates

    Metadata Created Date November 12, 2020
    Metadata Updated Date September 19, 2025
    Data Update Frequency irregular

    Metadata Source

    Harvested from NASA Data.json

    Other Data Resources

    Additional Metadata

    Resource Type Dataset
    Metadata Created Date November 12, 2020
    Metadata Updated Date September 19, 2025
    Publisher Dashlink
    Maintainer
    Identifier DASHLINK_783
    Data First Published 2013-06-19
    Data Last Modified 2025-03-31
    Public Access Level public
    Data Update Frequency irregular
    Bureau Code 026:00
    Metadata Context https://project-open-data.cio.gov/v1.1/schema/catalog.jsonld
    Schema Version https://project-open-data.cio.gov/v1.1/schema
    Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
    Harvest Object Id b30fe765-bdfa-4141-958c-3f9e8de6f917
    Harvest Source Id 58f92550-7a01-4f00-b1b2-8dc953bd598f
    Harvest Source Title NASA Data.json
    Homepage URL https://c3.nasa.gov/dashlink/resources/783/
    Program Code 026:029
    Source Datajson Identifier True
    Source Hash a28a5d93d382948b58b02cedcc62e83b833ac5933bf86d897e2b45eff78d117a
    Source Schema Version 1.1

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