Geothermal Environmental Exposure Testing of...
URL: https://gdr.openei.org/files/90/UCBerkeley_Pisano_Geothermal_Paper_1.pdf
Report detailing mass change and sputter XPS chemical analysis conducted on silicon, sapphire, silicon carbide (SiC), and aluminum nitride (AlN) after up to 100 hours of exposure testing in water at its critical point.
Source: Harsh Environment Sensors for Geothermal Applications
About this Resource
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| Name | Geothermal Environmental Exposure Testing of Encapsulant and Device Materials for Harsh Environment MEMS Sensor.pdf |
| Format | PDF File |
| License | Creative Commons Attribution |
| Created | 1 year ago |
| Media type | application/pdf |
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| id | e294539c-922f-412b-acc8-6cfac4394117 |
| metadata modified | 1 year ago |
| package id | d68432fc-5a5c-4434-8b7d-e774afc960a4 |
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| state | active |
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