DOI Access for Diffraction data for SRM 1979
URL: https://doi.org/10.18434/M32269
From the dataset abstract
These datasets are the high-resolution data collected at the APS 11-BM synchrotron beamline, and used to certify the microstructural characteristics of the two components (15 nm and 60 nm...
Source: Diffraction data for SRM 1979
About this Resource
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| Name | DOI Access for Diffraction data for SRM 1979 |
| Format | Web Resource |
| License | other-license-specified |
| Created | 5 years ago |
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| id | f82368ff-6cf1-4527-95ff-b9fad26be4fb |
| metadata modified | 5 years ago |
| package id | 877cbffb-2a69-4b65-aa25-d6e8dde7fd37 |
| position | 0 |
| state | active |
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